Main features>>

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• 26 million colors, 35 million pixels, brightness, color changes can be infinite
• 1000 or more stored waveforms and quantitative parameters
• 100 group of independent detection channels, automatic storage testing parameters
• First wave, second wave of auto-color display
• Low voltage alarm and automatic shutdown protection
• Automatically displays the values ​​of wave height within the gate
• Communications standardization, print the report format
• High-speed USB interface, providing read, transmission
• High-performance plug removable lithium polymer battery (with phone)
• Peak Memory echo envelope
• Automatic measurement of material thickness function
• Years clock, automatic time recording and reporting date
• Automatic measurement of velocity and thickness of material
• K value is automatically calculated, cutting-edge automatic deduction
• Theoretical curve DAC / measured curve / optional fitting curve
• Double-crystal production function testing curve
• Second, the three-wave thickness is automatically calculated based on the depth of defects
• DAC, AVG curve automatically generated
• Screen freeze computing
• Automatic tracking gate, defect echo parameters real-time display
• DAC, AVG simply repeating process, the gain is changed
• Data can be automatically input and fast input manually
• Memory a variety of standard and custom test

Special features>>

• Waveform Display: hollow waveform / waveform optional solid, bright light to read more intuitive
• Peak Memory: real-time retrieval defect highest wave, the maximum calibration defects
• Defect location: real significant level L, depth H, Cheng S sound
• Quantitative defect: optional assessment line, quantitative lines, waste lines sentenced to compare real-time read out dB when the value
• Ø value: direct probe testing identify defects in forging the highest value of equivalent Ø automatically converted wave
• Distance compensation: thick workpiece distance testing real-time compensation, to avoid missed small defects
• Peak envelope: The envelope waveform, supporting qualitative defect
• Waveform broadening: the gate of the waveform expansion to full screen, easy to observe the details of the waveform
• Rectification: Full detector, positive and negative detection, radio frequency waves show
• Dynamic record: record the whole process of testing, for analysis and archiving
• Computer playback: reproduction of the scene detection process, retrieve testing data, fill out and print inspection reports

Specifications>>

• Frequency: (0.5-20) MHz detection range :0-6000mm Vertical linear: ≤ 3%
• Resolution: ≥ 42dB sensitivity margin: ≥ 62dB linear level: ≤ 0.1%
• Dynamic Range: ≥ 32dB average electrical noise: ≤ 10% Dimension: 230x147x46 (mm)
• Can be accessed by the probe mode: double crystal probe, single-crystal probe optional
• Gain range :0-110dB, (0.1dB, 2dB, 6dB step, fully automatic quick adjustment)
• Power: 14.4V ± 10% DC, 220V ± 10% AC; battery greater than 8 hours of continuous work
• Display size: 5.7 "color TFT LCD, 640x480 dot matrix Weight: ≤ 1.2kg