• 40 independent testing channels, automatic memory of testing parameters
• Above 1000 Date sets in the S-memory
• Electronically generated 5.7'', semi-graticule, clear graticule
• Perpetual clock, automatic time and date recording
• DAC wave-accessing gate and wave-evanescing gate, adjustable continuously
• Free lightness, color, and bottom
• Automatic alarms in low voltage, automatic power-off
• Simultaneous linking to PC and printer
• Automatic testing effective of beam probe
• Communication standardization, formatted printing report
• Automatic calculation of double/triple triple traverse defect, according to board thickness
• Automatic DAC & AVG curves
• Screen freezing and calculating function
• Automatic display of peak value of internal wave at valve
• Free screed transfer, free testing
• Inbuilt various national standards and ministry standards
• Peak memory
• Automatic measure for velocity and thickness
• Automatic calculation of K value, automatic deduction in front
• Echo display area may cover the whole screen
• Flaw gate to monitor amplitude or thickness as well as presence of absence of signal
• DAC and AVG change with that of beam path distance and gain
• Automatic data-in and quick manual data-in
• Lithium battery

DUT-760  Main Features

• Gain range：0-100dB
• Testing range：0-6000mm
• Vertical Linear≤3%
• Horizontal Linear≤0.1%
• Resolution≥42dB
• Sensibility≥60dB
• Dynamic range≥32dB
• Average electrical noise≤10%
• Weight≤1.2kg